42

This is an old revision of the document!

ZEISS Σigma

This entry is kept as it was originally found! Responsible persons are most likely no longer responsible for the equipment, and its current status is not known to the admin team.

The ZEISS Σigma is a FESEM (field emmission scanning electron microscope) owned by the IEHK.

MCh ID no.: (fill only if known)
Nickname:
Inventory number: (fill only if known)
Person in charge: Hannah Schwich (IEHK), Wieslaw Tupiec (IEHK), Friederike Wittmers (MCh)
- Users: Adrian Rüßkamp (IEHK), Marcus Hans (MCh), Ole Achenbach (MCh), Holger Rueß (MCh)

Instrument data

Built:
Company:
Specifications:
- Zeiss ΣIGMA (FESEM):
  - Electron source: Schottky thermal field emitter
  - Detectors: In-lens, SE, BSE
  - Resolution: 2.8 nm @ 1 kV, 1.5 nm @ 15 kV
  - Acceleration voltage: 0.2 - 30 kV
  - Magnification: 10x - 10⁶x
  - Probe current: 4 pA - 100 nA Option
- Oxford Instruments X-MaxN 50 (EDS):
  - Detector: SDD (Silicon Drift Detector)
  - Detector size: 50 mm²
- EBSD:
  - ?

Documentation

Please write down a short MCh user manual or upload corresponding scans.

See current status and issues
Back to the list